Join us at the Future of Memory and Storage this August. Carter Snay, Technical Manager in Datacenter Technologies will be speaking on Testing NVMe Devices. If you're attending this year's FMS, we would like to connect. Email us today to schedule a time with Carter or Irvin with Member Services during the event.
Session Overview:
There are a variety of approaches to test NVMe devices. Reliability Testing of Emerging NVMs: We look at the challenge of measuring reliability, endurance, and understanding characteristics of emerging non-volatile memory technologies to shorten time-to-results while ensuring high-quality technology data. We delve into the process of developing new tests for the latest NVMe features, such as computational storage. We discuss an NVMe/NVMe-oF Compliance Test Platform offering a cost-effective, pluggable solution. We explore the importance of optimizing SSD storage for AI and ML applications by understanding the AI and ML pipeline, workload characteristics, and data requirements.
Speaker at FMS: Testing NVMe Devices
Date:
Wednesday, August 6, 2025 - 3:00pm